Semiconductor material and device characterization

Contact resistance and Schottky barriers, optical characterization. Interface traps and inversion charge frequency response to the extraction of the effective mobility. X-Ray and Gamma-Ray techniques, schematic of a scanning electron microscope.

Рубрика Физика и энергетика
Вид книга
Язык английский
Дата добавления 11.06.2014
Размер файла 11,5 M

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